HP 5890 Series II Plus Reference Manual page 236

Hewlett-packard reference manual
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Test Sample Chromatograms
Test sample chromatograms
Figure 10-12.
Detector Type ECDw/MUG
Temp 300 DEGREES C
Inlet Type Ded On-Column
Oven Track
Temp
Operating Mode
Purge Time On
Purge Time Off
Oven Isothermal
Init Temp
Init Time
Ramp
Rate
Fin Temp
Fin Time
Flow Param (EPP)
Constant Flow
Range 2
COLUMN:
Part No.
19095S(#100)
Dimensions
Sta Phase Methyl Silicone
ECD-On-Column Capillary Inlet
236
HP 5890 Test Sample Operating
Conditions
On
N/A
N/A
N/A
min
N/A
min
170
DEGREES C
N/A
min
0
Off
¿
530
MID; 5 m
3
.4
3
3.
5
FLOW RATES
Carrier (He)
15 +/• 1
Hydrogen
Air
Makeup (N2)
Split Vent
Septum Purge
SAMPLE:
Type
ECD Sample
Inj Volume
1
Part No. 18713•60040
Composition 33 pg/
(0.033 ppm (W/V)) each: lindane
and aldrin in isooctane
LINDANE
1.29
ALDRIN
ml/min
N/A
ml/min
N/A
ml/min
60+/•2
ml/min
N/A
ml/min
60+/•1
ml/min
¿
l
¿
l
3
.
5

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