HP 5890 Series II Plus Reference Manual page 227

Hewlett-packard reference manual
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Test Sample Chromatograms
Test sample chromatograms
Figure 10-3.
Detector Type ECD(or ECDw/MUG)
Temp 300 DEGREES C
Inlet Type PACKED (OR PURGED
PACKED).
Temp 200 DEGREES C
Operating Mode
Purge Time On
Purge Time Off
Oven Temp Isothermal
Init Temp
Init Time
Ramp
Rate
Fin Temp
Fin Time
Range 2
COLUMN:
Part No.
19095S(#100)
Dimensions
Sta Phase
Methyl Silicone
Electron Capture Detector (ECD)
HP 5890 Test Sample Operating Conditions
N/A
N/A
min
N/A
min
160
DEGREES C
N/A
min
0
¿
530
MID; 5 m
START
2.
STOP
FLOW RATES
Carrier (N2)
Hydrogen
Air
Makeup (N2)
Split Vent
Septum Purge
SAMPLE:
Type
ECD Sample
Inj Volume
Part No. 18713•60040
Composition 33 pg/
ppm(W/V)) each:
aldrin in isooctane
LINDANE
.88
3
ALDRIN
5
30 +/• 1
ml/min
N/A
ml/min
N/A
ml/min
30 +/• 1
ml/min
N/A
ml/min
1•2
ml/min
¿
1
l
¿
l(0.033
and
.12
227

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